2023
Conference papers
- titre
- Minimum SRAM Retention Voltage: Insight about optimizing Power Efficiency across Temperature Profile, Process Variation and Aging
- auteur
- Y. Aslan, F. Cacho, T. Kumar, D. Janardan, A. Kumar, F. Giner, M. Faurichon, Lorena Anghel
- article
- 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS), IEEE, Jul 2023, Crete, Greece. pp.1-6, ⟨10.1109/IOLTS59296.2023.10224895⟩
- Accès au bibtex
-