2023
Conference papers
- titre
- On Using Cell-Aware Methodology for SRAM Bit Cell Testing
- auteur
- Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory Di Pendina, Patrick Girard, Arnaud Virazel
- article
- ETS 2023 - 28th IEEE European Test Symposium, May 2023, Venezia, Italy. pp.1-4, ⟨10.1109/ETS56758.2023.10174118⟩
- Accès au bibtex
-